Share Email Print
cover

Proceedings Paper

Disorder And Diffusion In Thin-Film Multilayers
Author(s): A. M. Saxena
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Practical multilayer devices usually have some in-built imperfections that adversely affect their properties. An analysis of the diffraction properties of a multilayer, and its comparison with the results obtained from a theoretical model of a multilayer with imperfections, can give information about the type and magnitude of imperfections in the multilayer. This information can then be used to make multilayers with better characteristics.

Paper Details

Date Published: 6 May 1985
PDF: 6 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949665
Show Author Affiliations
A. M. Saxena, Brookhaven National Laboratory (United States)


Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)

© SPIE. Terms of Use
Back to Top