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Proceedings Paper

Elliptical X-ray analyzer spectrograph application to a laser-produced plasma
Author(s): Tina J. Tanaka; Merrill A. Palmer; Burton L. Henke
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Paper Abstract

A preliminary experimental study was conducted on the application of an elliptical analyzer spectrograph to X-ray diagnostics of pulsed plasmas. This spectrograph was designed to record a range of 100-2000 eV X-rays on calibrated Kodak RAR-21497 film. Using point calibrations and theoretical models, the spectrograph efficiency was predicted. Basic spectrograph geometry and photographic calibrations are presented in companion papers. A 20 J, 6 ns duration Nd:glass laser pulse was focussed upon planar targets of gold, aluminum, teflon and boron carbide. Sample spectra for line and X-ray yields analysis are presented.

Paper Details

Date Published: 6 May 1985
PDF: 10 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949657
Show Author Affiliations
Tina J. Tanaka, Sandia National Laboratories (United States)
Merrill A. Palmer, Sandia National Laboratories (United States)
Burton L. Henke, Center for X-ray Optics (United States)

Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)

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