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Proceedings Paper

Aberration Analysis From Diffraction Patterns Produced By Annular Apertures
Author(s): Donald R. Erbschloe; James E. Harvey
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Paper Abstract

For points on and near the optical axis, asymptotic solutions to the Rayleigh-Sommerfeld diffraction integral are possible for annular apertures illuminated by plane waves of uniform intensity distribution containing rotationally symmetric Seidel aberrations (defocus and spherical aberration). Computer studies of these cases show excellent agreement with experiment. The amount of defocus and spherical aberration can be determined from shifts in positions of on-axis intensity extrema. An empirical study of the non-rotationally symmetric Seidel aberration astigmatism reveals a predictable change in the diffraction pattern allowing for the verification of the aberration to within .05 wavelengths.

Paper Details

Date Published: 10 May 1986
PDF: 12 pages
Proc. SPIE 0560, Diffraction Phenomena in Optical Engineering Applications, (10 May 1986); doi: 10.1117/12.949622
Show Author Affiliations
Donald R. Erbschloe, United States Air Force Academy (United States)
James E. Harvey, Perkin-Elmer (United States)


Published in SPIE Proceedings Vol. 0560:
Diffraction Phenomena in Optical Engineering Applications
Dale M. Byrne; James E. Harvey, Editor(s)

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