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Proceedings Paper

Accelerated Laser-Speckle Strain Gauge
Author(s): Ichirou Yamaguchi; Takeo Furukawa; Toshitsugu Ueda; Eiji Ogita
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Paper Abstract

An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.

Paper Details

Date Published: 25 November 1985
PDF: 7 pages
Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); doi: 10.1117/12.949532
Show Author Affiliations
Ichirou Yamaguchi, The Institute of Physical and Chemical Research (Japan)
Takeo Furukawa, The Institute of Physical and Chemical Research (Japan)
Toshitsugu Ueda, Yokogawa Hokushin Electric Corporation (Japan)
Eiji Ogita, Yokogawa Hokushin Electric Corporation (Japan)


Published in SPIE Proceedings Vol. 0556:
Intl Conf on Speckle
Henri H. Arsenault, Editor(s)

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