Proceedings PaperSpeckle Polarization Investigated By Novel Ellipsometer
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A novel ellipsometric method is introduced for the analysis of speckle patterns. The method is based on the illumination of the scattering object by a plane-polarized light beam with its polarization plane rotating. The speckle pattern produced by the scattered light is then investigated for its polarization characteristics. An approximate theory is outlined and compared with experimental measurements demonstrating the usefulness of the method as a powerful surface analytic tool.