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Proceedings Paper

Speckle Polarization Investigated By Novel Ellipsometer
Author(s): Joseph Shamir
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Paper Abstract

A novel ellipsometric method is introduced for the analysis of speckle patterns. The method is based on the illumination of the scattering object by a plane-polarized light beam with its polarization plane rotating. The speckle pattern produced by the scattered light is then investigated for its polarization characteristics. An approximate theory is outlined and compared with experimental measurements demonstrating the usefulness of the method as a powerful surface analytic tool.

Paper Details

Date Published: 25 November 1985
PDF: 6 pages
Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); doi: 10.1117/12.949528
Show Author Affiliations
Joseph Shamir, Israel Institute of Technology (Israel)

Published in SPIE Proceedings Vol. 0556:
Intl Conf on Speckle
Henri H. Arsenault, Editor(s)

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