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Proceedings Paper

Statistical Properties of the Speckle Phase in Image and Diffraction Fields
Author(s): N. Takai; H. Kadono; T. Asakura
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Paper Abstract

The speckle phases are studied statistically in both image and diffraction fields. The general analysis for these studies is given by introducing an optical "system function" and the results are applied to the analysis of the speckle phases in both fields. The speckle phase distributions are evaluated by a phase angle defined as the extent of the equi-probability density ellipse stretched from the origin in the complex plane of the speckle amplitude.

Paper Details

Date Published: 25 November 1985
PDF: 10 pages
Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); doi: 10.1117/12.949524
Show Author Affiliations
N. Takai, Hokkaido University (Japan)
H. Kadono, Hokkaido University (Japan)
T. Asakura, Hokkaido University (Japan)


Published in SPIE Proceedings Vol. 0556:
Intl Conf on Speckle
Henri H. Arsenault, Editor(s)

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