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Proceedings Paper

Standardization Of Environmental Test Conditions
Author(s): Masaki Isshiki
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Paper Abstract

ISO Technical Committee (TC) 172 "Optics and Optical Instruments" was organized in June 1978 at the inaugural meeting at Pforzheim West-Germany. TC 172 is composed of nine Subcommittees and the work of the Subcommittee (SC) 1 "Fundamental Standards" was divided into 3 items, for each of which a Working Group (WG) is formed and WG 3 was in charge of preparing the draft standards for "Environmental Test Conditions." The urgent need for that standardization was stressed by one of the U.K. delegates in 1980 at the first meeting of SC 1. However, the actual work of the WG 3 started in 1982. The delay was due to the controversy as to selecting the basic structure of the standard. Another Problem was how to determine the boundary of WG 3's field, because this item extends so widely that interferences with the task of other groups, such as IEC, would be unavoidable. Finally the group decided to divide a big volume of draft into a number of parts and publish them one after another as soon as each of them is accomplished. It was the general agreement of the group members to avoid pursuing the perfectness of the draft too persistently. That seemed impossible because of the complicated character of the field. The prompt publishment of the draft would evoke discussions from the experts in the world which would contribute to improve it. At the end of 1985, draft proposals ISO DP 9022, Optics and optical instruments -Environmental test methods; Part 1 - 14 were accomplished. The working group is still actively working out the additional parts of that DP. In this report the outline of the standard will be reported with the its future prospects.

Paper Details

Date Published: 11 April 1989
PDF: 2 pages
Proc. SPIE 1015, Micromachining Optical Components and Precision Engineering, (11 April 1989); doi: 10.1117/12.949467
Show Author Affiliations
Masaki Isshiki, Tokyo Institute of Polytechnics (Japan)

Published in SPIE Proceedings Vol. 1015:
Micromachining Optical Components and Precision Engineering
Peter Langenbeck, Editor(s)

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