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Proceedings Paper

Calculated And Measured Refractive Index Profiles Of K+-Exchanged Glass-Waveguides
Author(s): Karl Spenner; Albrecht Brandenburg; Wulf Lotze
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Paper Abstract

K+-exchanged film and stripe waveguides have been fabricated. The diffusion time varied between one and 16 hours. m-line spectroscopy was used to characterize the waveguides. The refractive index profile of those waveguides is proportional to a concentration profile calculated under the assumption that the number of indiffused ions is limited by the glass network to a constant value at the surface. From those profiles derived n eff-values and near-fields compare well with the measurements in a wide range of strip widths and diffusion times. The waveguides can be described by four parameters: a constant ∆ N, the stripe width, the diffusion time and the diffusion coefficient.

Paper Details

Date Published: 5 April 1989
PDF: 7 pages
Proc. SPIE 1014, Micro-Optics, (5 April 1989); doi: 10.1117/12.949436
Show Author Affiliations
Karl Spenner, Fraunhofer-Institut fur Physikalische Messtechnik (Germany)
Albrecht Brandenburg, Fraunhofer-Institut fur Physikalische Messtechnik (Germany)
Wulf Lotze, Fraunhofer-Institut fur Physikalische Messtechnik (Germany)


Published in SPIE Proceedings Vol. 1014:
Micro-Optics
Anna Maria Verga Scheggi, Editor(s)

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