Share Email Print

Proceedings Paper

Aberration Properties Of The Planar Microlens Array And Its Applicatio S To Imaging Optics
Author(s): K. Hamanaka; H. Nemoto; M. Oikawa; E. Okuda
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Aberration properties of planar microlens arrays, which are small lenslet arrays fabricated by an ion exchange technique, are described. The optical set-up of the measurement system. is designed to combine a Mach-Zehnder interferometer, a microscope imaging set-up and fringe scanning analysis to obtain precise measurements for microlenses. Many types of planar microlens have been measured, and the spherical aberration, coma in off-axis imaging etc., were evaluated. The experimental results indicate that the planar microlens can perform high quality imaging in a wide image field. Also, by using planar microlens arrays, multiple imaging optical systems in incoherent and coherent illumination are demonstrated.

Paper Details

Date Published: 5 April 1989
PDF: 0 pages
Proc. SPIE 1014, Micro-Optics, (5 April 1989); doi: 10.1117/12.949423
Show Author Affiliations
K. Hamanaka, Nippon Sheet Glass Co. Ltd. (Japan)
H. Nemoto, Nippon Sheet Glass Co. Ltd. (Japan)
M. Oikawa, Nippon Sheet Glass Co. Ltd. (Japan)
E. Okuda, Nippon Sheet Glass Co. Ltd. (Japan)

Published in SPIE Proceedings Vol. 1014:
Anna Maria Verga Scheggi, Editor(s)

© SPIE. Terms of Use
Back to Top