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Proceedings Paper

Accelerometer Design Based On Attenuated Total Reflection
Author(s): M. Owner-Petersen; Bo-Shen Zhu; Torben Licht
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Paper Abstract

It is shown that the effect of attenuated total internal reflection (ATR) might be used for accelerometer design. Although the ATR-accelerometer will never outdate the conventional piezoelectrical accelerometer, it possesses some obvious advantages: Its performance is not limited by a Curie-Temperature, and since it is a purely optical device, it can be used in electrically noisy surroundings. Preliminary measurements on a prototype design are presented, and the performance with respect to optical, mechanical and thermal properties including noise-limitations are discussed.

Paper Details

Date Published: 10 March 1989
PDF: 6 pages
Proc. SPIE 1012, In-Process Optical Measurements, (10 March 1989); doi: 10.1117/12.949337
Show Author Affiliations
M. Owner-Petersen, The Technical University of Denmark (Denmark)
Bo-Shen Zhu, The Technical University of Denmark (Denmark)
Torben Licht, Bruel & Kjaer A/S (Denmark)


Published in SPIE Proceedings Vol. 1012:
In-Process Optical Measurements
Kenneth H. Spring, Editor(s)

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