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Proceedings Paper

Use Of Surface Enhanced Raman Scattering To Characterize Metal Substrate
Author(s): Kamel M. El-Shokrofy; Sohair Negm; H. Talaat
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Paper Abstract

It is proposed that surface enhanced Raman scattering (SERS) of a monolayer of a dye deposited on a rough metal surface can be used to characterize the film roughness. The advantage of these techniques is the use of a very sensitive methods (Raman scattering signal) to measure microscopic roughness in metal substrate. The Raman enhancement is due to the amplification by the Ag core of the electric field associated with the driven modes of the dye layer. In the present case the due is crystal violet (CV) and the measured enhancements are calculated to be of the order of 104 to 106. Since, the enhancement of the Raman spectra depends on the structure of the metal island film and specially the roughness, this effect can be applied to investigate the surface roughness of the substrate and characterize its structure.

Paper Details

Date Published: 21 March 1989
PDF: 5 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949182
Show Author Affiliations
Kamel M. El-Shokrofy, Menoufia University (Egypt)
Sohair Negm, Banha University (Egypt)
H. Talaat, Ain Shams University (Egypt)


Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

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