Share Email Print
cover

Proceedings Paper

Application Of Non-Stereoscopic Secondary Electron Microscopy And Optical Spectroscopy For The Evaluation Of A Pronounced Microroughness
Author(s): Michael Kohl; Thomas Walter; Karlhanns Gindele
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Absorber coatings for solar-thermal energy conversion must have a low reflectance in the wavelength range of the solar irradiation and a high reflectance in the range of thermal radiation. There are several physical principles providing such a spectral behaviour. One of them is a surface microroughness with an rms-roughness smaller than 0.5 µm and a correlation length of the same order of magnitude or smaller. Only few measurement techniques can be used for the characterization of such a microstructure. This paper will discuss the applicability of non-stereoscopic scanning electron microscopy (SEM) with digital image processing for the evaluation of the correlation length of the microstructure. Emphasis will lie on the investigation of pyramidal structures, for which angular dependent SEM can yield additional information about the mean slope of the structure. The results are compared with the outcome of the evaluation of spectrooptical measurements in the wavelength range from 0,36 - 15 µm by means of statistical scattering theories. These measurements are carried out with a Zeiss PMQ3-spectrophotometer-system with a BaSO4-coated integrated sphere (0.36-2.5 µm), and with a Bruker FTIR spectrometer equipped with a diffuse-gold coated integrating sphere (2,0 - 15 µm), respectively.

Paper Details

Date Published: 21 March 1989
PDF: 12 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949181
Show Author Affiliations
Michael Kohl, University of Stuttgart (Germany)
Thomas Walter, University of Stuttgart (Germany)
Karlhanns Gindele, University of Stuttgart (Germany)


Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

© SPIE. Terms of Use
Back to Top