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Proceedings Paper

Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering
Author(s): Karl H. Guenther
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Paper Abstract

Quasi-calibrated, easy-to-use visual methods for assessing the roughness (or smoothness) of optical surfaces and thin film coatings in the optical shop are investigated as to their correlation with instrumental surface roughness measurement methods. An intriguing relation between visual relative ranking of optical surfaces with the aid of a Nomarski microscope and the fractal dimension of their scattered light field is described in some detail.

Paper Details

Date Published: 21 March 1989
PDF: 10 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949175
Show Author Affiliations
Karl H. Guenther, University of Central Florida (United States)


Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

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