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Proceedings Paper

Validation Of A Local Defect Classification Procedure
Author(s): Aline Huard; Jean Paul Marioge; Jean Luc Hautcolas; Michel Munier
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Paper Abstract

The following describes a new procedure used for the classification of local defects on optical surfaces by use of the observer's eye contrast threshold. A new apparatus which works in transmission or reflection was constructed and tested. We will describe the principle and give the results of the experiments carried out with this work station. This study was financed by the Centre Technique des Industries Mecaniques and the Centre National de la Recherche Scientifique. Technical follow up was provided by the Groupement des industries francaises de l'optique.

Paper Details

Date Published: 21 March 1989
PDF: 16 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949174
Show Author Affiliations
Aline Huard, Institut d'Optique Theorique et Appliquee (France)
Jean Paul Marioge, Institut d'Optique Theorique et Appliquee (France)
Jean Luc Hautcolas, Et. d'Armement AMX-APX (France)
Michel Munier, Et. d'Armement AMX-APX (France)

Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

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