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Proceedings Paper

Assessment Of Surface Topography By X-Ray Scattering Measurements
Author(s): Bernd Aschenbach; Heinrich Brauninger
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Paper Abstract

In the context of developing optics for X-ray astronomy, measurements of a variety of flat mirrors and telescopes have revealed that the total integrated scatter (TIS) formalism, well known in the optical regime, also describes the surface scattering of soft X-rays. The topography of mirror surfaces can be well studied by angle resolved X-ray scattering, from which e.g. the power spectrum and auto-covariance function of surface irregularities can be inferred. X-rays can also be used as diagnostic tool to identify surface slope changes and periodic like structures. A quantitative formalism is derived to separate the spectrum of spatial surface wavelengths into components which can be treated in a geometrical optics appraoch and those which need exact diffraction treatment. This formalism has been applied to predict the X-ray point spread function of telescopes from mechanical profile measurements. The agreement between prediction and X-ray measurement is remarkably good.

Paper Details

Date Published: 21 March 1989
PDF: 8 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949171
Show Author Affiliations
Bernd Aschenbach, Max-Planck-Institut fur Physik und Astrophysik (Germany)
Heinrich Brauninger, Max-Planck-Institut fur Physik und Astrophysik (Germany)


Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

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