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Proceedings Paper

Characterization Of Mirror Surfaces For Laser-Gyro Applications
Author(s): Dirk-Roger Schmitt
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Paper Abstract

Low scatter mirror substrates for laser-gyro applications were investigated. Bare samples, prepared by different especially developed polishing processes were examined. Nomarski differential interference contrast microscopy was used to get an overview of the surfaces. It is demonstrated that this system yields a rms roughness resolution better than 0.1 nm. To objectify the results of the Nomarski system the total integrated scattering of the bare substrates was measured. For this purpose an Ulbricht integrating sphere with a special designed diaphragm to block unwanted light scatter by the rear side of the transparent substrate was used. Investigations of different surfaces gave results for the total integrated scattering from 10.10-6 to 3850.10-6 ; the corresponding rms roughnesses are 0.19 nm and 3.61 nm, respectively. Furthermore an especially developed polishing process which produces surfaces with a roughness of about 0.1 nm and probably lower is being discussed.

Paper Details

Date Published: 21 March 1989
PDF: 10 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949167
Show Author Affiliations
Dirk-Roger Schmitt, Institut fur Flugfuhrung (Germany)

Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

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