Share Email Print

Proceedings Paper

Instrumental Effects In Surface Finish Measurement
Author(s): E. L. Church; P. Z. Takacs
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The derivation of surface-finish statistics from profile measurements are reviewed with emphasis on the corrections and limitations imposed by the measurement process itself. These issues are important for the comparison of the results of different types of measurements, connecting results with functional surface properties, and evaluating different finishing techniques.

Paper Details

Date Published: 21 March 1989
PDF: 10 pages
Proc. SPIE 1009, Surface Measurement and Characterization, (21 March 1989); doi: 10.1117/12.949154
Show Author Affiliations
E. L. Church, USA ARDEC (United States)
P. Z. Takacs, Brookhaven National Laboratory (United States)

Published in SPIE Proceedings Vol. 1009:
Surface Measurement and Characterization
Jean M. Bennett, Editor(s)

© SPIE. Terms of Use
Back to Top