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Proceedings Paper

Structured Highlight Inspection Of Specular Surfaces Using Extended Gaussian Images
Author(s): Shree K. Nayar; Lee E. Weiss; David A. Simon; Arthur C. Sanderson
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Paper Abstract

The structured highlight inspection method uses an array of point sources to illuminate a specular object surface. The point sources are scanned and highlights on the object surface resulting from each source are used to derive local surface orientation information. The Extended Gaussian Image (EGI) is obtained by placing at each point on a Gaussian sphere a mass proportional to the area of points on the object surface that have a specific orientation. The EGI summarizes shape properties of the object surface and may be efficiently calculated from structured highlight data without surface reconstruction. Features of the estimated EGI including areas, moments, principal axes, homogeneity measures, and polygonality may be used as the basis for classification and inspection. The SHINY Structured Highlight INspection sYstem has been implemented using a hemisphere of 127 point sources. The SHINY system uses a binary coding scheme to make the scanning of point sources efficient. Experiments have used the SHINY system and EGI features for the inspection and classification of surface mounted solder joints. These experiments show excellent consistency with visual inspection and demonstrate the feasibility of the approach for production line inspection systems.

Paper Details

Date Published: 7 March 1989
PDF: 10 pages
Proc. SPIE 1005, Optics, Illumination, and Image Sensing for Machine Vision III, (7 March 1989); doi: 10.1117/12.949050
Show Author Affiliations
Shree K. Nayar, Carnegie Mellon University (United States)
Lee E. Weiss, Carnegie Mellon University (United States)
David A. Simon, Carnegie Mellon University (United States)
Arthur C. Sanderson, Carnegie Mellon University (United States)

Published in SPIE Proceedings Vol. 1005:
Optics, Illumination, and Image Sensing for Machine Vision III
Donald J. Svetkoff, Editor(s)

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