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Proceedings Paper

Cryogenic Production Testing
Author(s): R. K. Buchness; E. Banks; J. Doidge; A. Gable; L. Nelson; D. Olsen
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Paper Abstract

Rockwell has realized rapid testing of Infrared Focal Plane Arrays (IRFPAs) using a totally automated cryogenic test station with the latest technology in device handling, data acquisition, illumination and throughput capabilities. This station provides testing of HgCdTe Focal Plane Arrays fabricated in a fully certified production facility. All aspects of this facility are under Quality Control surveillance including the hardware and software used by the automated test station.

Paper Details

Date Published: 28 October 1985
PDF: 3 pages
Proc. SPIE 0550, Sensor Design Using Computer Tools II, (28 October 1985); doi: 10.1117/12.948858
Show Author Affiliations
R. K. Buchness, Rockwell International Corporation (United States)
E. Banks, Rockwell International Corporation (United States)
J. Doidge, Rockwell International Corporation (United States)
A. Gable, Rockwell International Corporation (United States)
L. Nelson, Rockwell International Corporation (United States)
D. Olsen, Rockwell International Corporation (United States)


Published in SPIE Proceedings Vol. 0550:
Sensor Design Using Computer Tools II
John A. Jamieson, Editor(s)

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