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Proceedings Paper

The Modelling Of X-Ray Reflectivity From Ideal And Imperfect Multilayer Systems.
Author(s): P. G. Harper
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Paper Abstract

A review is presented of current theoretical topics relating to the modelling of X-reflectivity from multilayer structures. The topics comprise: (1) Fresnel theory and its limitations; (2) atomic plane iterated diffraction; (3) sinusoidal layering and optical Bloch waves; (4) imperfect layers.

Paper Details

Date Published: 16 December 1988
PDF: 10 pages
Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); doi: 10.1117/12.948782
Show Author Affiliations
P. G. Harper, Heriot-Watt University (Scotland)


Published in SPIE Proceedings Vol. 0984:
X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers
Finn Erland Christensen, Editor(s)

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