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Proceedings Paper

Tests Of Short Period X-Ray Multilayer Mirrors Using A Position Sensitive Proportional Counter
Author(s): P. Dhez; S. Megtert; M F Ravet; E Ziegler
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Paper Abstract

A 1D Position Sensitive Detector is well-suited to the test of the short period X-ray multilayer produced for X-ray fluorescence analysis systems and for synchrotron beam lines optics. Because it gives directly the incident and reflected angular beam distributions the PSD avoids the time-consuming scanning mode necessary for the classical detectors. In such tests classical X-ray tubes have been used. Some examples of reflectivity tests for multilayer mirrors with periods ranging from 113Å to 24Å are presented. A way is indicated to improve the 0.03° angular resolution which presently limits our reflectivity measurements possibility.

Paper Details

Date Published: 16 December 1988
PDF: 6 pages
Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); doi: 10.1117/12.948774
Show Author Affiliations
P. Dhez, Universite Paris (France)
S. Megtert, Universite Paris (France)
M F Ravet, CNRS (France)
E Ziegler, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 0984:
X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers
Finn Erland Christensen, Editor(s)

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