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Proceedings Paper

Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers
Author(s): J. E. Keem; J. Wood; N. Grupido; K. Hart; S. Nutt; D. G. Reichel; W. B. Yelon
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Paper Abstract

Analysis of Ni-Ti multilayer neutron reflectors and supermirrors has been undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations have focused attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used in this investigation. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers.

Paper Details

Date Published: 18 January 1989
PDF: 16 pages
Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); doi: 10.1117/12.948745
Show Author Affiliations
J. E. Keem, Ovonic Synthetic Materials Company (United States)
J. Wood, Ovonic Synthetic Materials Company (United States)
N. Grupido, Ovonic Synthetic Materials Company (United States)
K. Hart, Ovonic Synthetic Materials Company (United States)
S. Nutt, Brown University (United States)
D. G. Reichel, University of Missouri Research Reactor Facility (United States)
W. B. Yelon, University of Missouri Research Reactor Facility (United States)


Published in SPIE Proceedings Vol. 0983:
Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides
Charles F. Majkrzak, Editor(s)

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