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Proceedings Paper

Development And Test Of Fully Depleted Pn-CCD's For X-Ray Detection
Author(s): L. Struder; H. Brauninger; G. Lutz; M. Meier; P. Predehl; M. Sterzik; J. Kemmer; P. Rehak
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Paper Abstract

Fully depletable pn CCD's on high resistivity 280 pm thick silicon (e e:-, 2.5 kIlcm) have been fabricated. Their operation is based on the semiconductor drift chamber principle proposed by Gatti and Rehak. They are designed as energy and position sensitive radiation detectors for X-rays and (minimum-) ionizing particles. Two-dimensional semiconductor device modeling demonstrates the basic charge transfer mechanisms. Prototypes of the detectors have been tested in quasistatic and dynamic conditions. A preliminary charge transfer inefficiency e, has been determined to less than 10-3 at shift frequencies varying between 500 kHz and 6 MHz. The charge loss during the transfer is discussed. As a consequence, an improved design had been developed for a new fabrication iteration which is currently being tested.

Paper Details

Date Published: 21 December 1988
PDF: 10 pages
Proc. SPIE 0982, X-Ray Instrumentation in Astronomy II, (21 December 1988); doi: 10.1117/12.948710
Show Author Affiliations
L. Struder, Max-Planck-Institut fur Physik und Astrophysik (Germany)
H. Brauninger, Max-Planck-Institut fur Physik und Astrophysik (Germany)
G. Lutz, Max-Planck-Institut fur Physik und Astrophysik (Germany)
M. Meier, Max-Planck-Institut fur Physik und Astrophysik (Germany)
P. Predehl, Max-Planck-Institut fur Physik und Astrophysik (Germany)
M. Sterzik, Max-Planck-Institut fur Physik und Astrophysik (Germany)
J. Kemmer, Messerschmitt-Bolkow-Blohm GmbH (Germany)
P. Rehak, Brookhaven National Laboratory (United States)


Published in SPIE Proceedings Vol. 0982:
X-Ray Instrumentation in Astronomy II
Leon Golub, Editor(s)

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