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Proceedings Paper

Fano-Noise-Limited CCDs
Author(s): James Janesick; Tom Elliott; Richard Bredthauer; Charles Chandler; Barry Burke
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Paper Abstract

Recent developments of scientific CCDs have produced sensors that achieve ultra low read noise performance (less than 2 electrons rms) and near perfect charge transfer efficiency (0.9999996) without the addition of a fat-zero. This progress has now made it possible to achieve Fano-noise-limited performance in the soft x-ray where the detector's energy resolution is primarily limited by the statistical variation in the charge generated by the interacting x-ray photon. In this paper, Fano-noise-limited test data is presented for two different CCD types and a CCD derived estimate of the Fano factor is determined. By evaluating ultra low-modulation images (less than 1 electron peak-to-peak) it is shown that the CCD's global CTE is now superior to its read noise floor. To capitalize on this capability CCD manufacturers are now focusing their attention on reducing the noise floor below the 1 electron level thereby matching the sensor's CTE performance. This improvement, if accomplished, will push Fano-noise-limited performance for the CCD into the extreme ultra-violet.

Paper Details

Date Published: 21 December 1988
PDF: 26 pages
Proc. SPIE 0982, X-Ray Instrumentation in Astronomy II, (21 December 1988); doi: 10.1117/12.948704
Show Author Affiliations
James Janesick, California Institute of Technology (United States)
Tom Elliott, California Institute of Technology (United States)
Richard Bredthauer, Ford Aerospace Corporation (United States)
Charles Chandler, Ford Aerospace Corporation (United States)
Barry Burke, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0982:
X-Ray Instrumentation in Astronomy II
Leon Golub, Editor(s)

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