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Proceedings Paper

Modular Cryogenic Test Dewar For Infrared Focal Plane Array Testing
Author(s): John K. Henriksen; Warren G. Pierce
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Paper Abstract

For many years the cryogenic hardware utilized in the development and quality control testing of infrared focal plane arrays and modules has been custom designed for each application. Conversion of a system to test devices in different packages usually required expensive and time consuming rework of the system or construction of new hardware. This paper describes a system with modular construction which can be quickly reconfigured to satisfy a wide variety of test requirements. Other problems, such as the large number of vacuum chamber penetrations, and the associated potential for leaks, rapid cool-down/warmup, and the need for cooled optics have been successfully addressed. Variations on the basic design allow for signal lead counts as high as 250 50 ohm (impedance) signal lines in a compact unit without sacrificing the low noise and crosstalk characteristics of systems with discrete feedthroughs.

Paper Details

Date Published: 27 April 1988
PDF: 10 pages
Proc. SPIE 0973, Cryogenic Optical Systems and Instruments III, (27 April 1988); doi: 10.1117/12.948369
Show Author Affiliations
John K. Henriksen, Lake Shore Cryotronics, Inc (United States)
Warren G. Pierce, Lake Shore Cryotronics, Inc (United States)


Published in SPIE Proceedings Vol. 0973:
Cryogenic Optical Systems and Instruments III
Ramsey K. Melugin; Warren G. Pierce, Editor(s)

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