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Proceedings Paper

Measurement Of Small Temperature Fluctuations At High Average Temperature
Author(s): James W Scholl; Marija S. Scholl
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Paper Abstract

Both absolute and differential temperature measurements were simultaneously performed as a function of time for a pixel on a high-temperature, multi-spectral, spatially and temporally varying infrared target simulator. A scanning laser beam was used to maintain a pixel at an on-the-average constant temperature of 520 K. The laser refresh rate of up to 1 kHz resulted in small-amplitude temperature fluctuations with a peak-to-peak amplitude of less than 1 K. The experimental setup to accurately measure the differential and the absolute temperature as a function of time is described.

Paper Details

Date Published: 7 December 1988
PDF: 7 pages
Proc. SPIE 0972, Infrared Technology XIV, (7 December 1988); doi: 10.1117/12.948325
Show Author Affiliations
James W Scholl, Alenka Associates (United States)
Marija S. Scholl, California Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0972:
Infrared Technology XIV
Irving J. Spiro, Editor(s)

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