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Proceedings Paper

Theoretical Issues In Amorphous-Silicon Materials And Device Research
Author(s): David Adler
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Paper Abstract

The characterization necessary to account for the physical properties and device performance of any semiconducting material is presented. This can be divided into five major categories. The results of intensive studies of hydrogenated amorphous silicon thin films are reviewed in detail. It is concluded that many important characteristics of these commercially important materials are still not known with any degree of certainty.

Paper Details

Date Published: 9 May 1985
PDF: 14 pages
Proc. SPIE 0543, Photovoltaics, (9 May 1985); doi: 10.1117/12.948202
Show Author Affiliations
David Adler, Massachuietts Institute of Technology (United States)

Published in SPIE Proceedings Vol. 0543:
Satyen K. Deb, Editor(s)

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