Share Email Print
cover

Proceedings Paper

Defect Centers Induced By Linear And Non-Linear Absorption Of UV Light In High Purity Silica
Author(s): T. E. Tsai; D. L. Griscorn; E. J. Friebele
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Defect centers induced by 6.4 eV laser light in high purity silica were studied by electron spin resonance (ESR). Both Si E' centers, and non-bridging oxygen hole centers (NBOHCs) were observed. However, the E' center was the dominant defect in type III synthetic silicas (1200 ppm OH), while the NBOHC was dominant in type IV silicas (< 5 ppm OH). Formyl radicals (HCO) and hydrogen-associated centers were also observed in high-water silica. The concentrations of both Si E' centers and NBOHCs were found to increase as the square of the 6.4 eV laser power suggesting that they are induced through non-linear absorption of UV light. By contrast, we find that the HCO concentration increases linearly at low laser power, saturates, and decreases at high power. Excitons induced by the non-linear absorption of UV light are inferred to be responsible for the generation of these observed defect centers in high purity silica.

Paper Details

Date Published: 16 January 1989
PDF: 5 pages
Proc. SPIE 0970, Properties and Characteristics of Optical Glass, (16 January 1989); doi: 10.1117/12.948201
Show Author Affiliations
T. E. Tsai, Naval Research Laboratory (United States)
D. L. Griscorn, Naval Research Laboratory (United States)
E. J. Friebele, Naval Research Laboratory (United States)


Published in SPIE Proceedings Vol. 0970:
Properties and Characteristics of Optical Glass
Alexander J. Marker, Editor(s)

© SPIE. Terms of Use
Back to Top