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Proceedings Paper

Spectral Correlation Of Semiconductor Lasers
Author(s): Peter T. Johnson; John E. Carroll
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Paper Abstract

A novel technique for measuring the spectral properties of single-mode, semiconductor lasers for use in coherent optical communication systems is being explored. Unlike conventional linewidth/lineshape measurements both amplitude and phase information is retained in a complex spectral correlation function. In principle this should give additional insight into both the amplitude noise and phase noise processes within the laser that determine lineshape. The paper discusses the method and the problems involved.

Paper Details

Date Published: 27 January 1989
PDF: 6 pages
Proc. SPIE 0965, Current Developments in Optical Engineering III, (27 January 1989); doi: 10.1117/12.948021
Show Author Affiliations
Peter T. Johnson, Cambridge University (England)
John E. Carroll, Cambridge University (England)


Published in SPIE Proceedings Vol. 0965:
Current Developments in Optical Engineering III
Robert E. Fischer; Warren J. Smith, Editor(s)

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