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Proceedings Paper

A Vapor Leak Sensor Using Polarization Property For Plant Inspection
Author(s): Toshiro Nakajima; Mitsuhito Kamei
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Paper Abstract

This paper deals with the development of a vapor leak sensor for plant inspection. The sensor requires the ability to selectively detect troubles in various circumstances. The method to detect vapor leak is based on the detection of scattered light. The experiment on polarization property shows that there is large difference between the scattered light from vapor and that from structures in a plant, and that the method is effective for the distinction of the two scattered lights. As a result of our experiment, it is confirmed that the sensor enables us to selectively detect the vapor leak with high sensitivity even in a plant and has high performance for plant inspection.

Paper Details

Date Published: 27 January 1989
PDF: 6 pages
Proc. SPIE 0965, Current Developments in Optical Engineering III, (27 January 1989); doi: 10.1117/12.948012
Show Author Affiliations
Toshiro Nakajima, Mitsubishi Electric Corporation (Japan)
Mitsuhito Kamei, Mitsubishi Electric Corporation (Japan)

Published in SPIE Proceedings Vol. 0965:
Current Developments in Optical Engineering III
Robert E. Fischer; Warren J. Smith, Editor(s)

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