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Proceedings Paper

Automated Mode Shape Measurement By A Modulated-Fringe Technique Using Electronic Speckle Pattern Interferometry
Author(s): Paul S. Sherman; Vernon M. Fernandez; Yau Y. Hung
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Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) is a full-field and non-contact technique for measuring surface displacements. However, one difficulty in the use of the technique is the ambiguity in fringe interpretation. This paper presents a modulated-fringe technique which removes the fringe ambiguity. By strobing the laser light, two speckle images of an object in steady state vibration can be digitally recorded. Shifting the illumination beam between exposures produces a linear phase variation which is added to the phase change induced by the vibrational displacements. The result is a modulated-fringe pattern which has monotonically increasing fringe orders. This permits the fringe orders to be determined in a staight forward manner and without ambiguity. The phase change due to vibrational displacement alone is then obtained by simply subtracting the known linear phase variation. Elimination of fringe ambiguity has paved a way for automatic data reduction of the vibration mode shape by digital image processing.

Paper Details

Date Published: 14 December 1988
PDF: 8 pages
Proc. SPIE 0955, Industrial Laser Interferometry II, (14 December 1988); doi: 10.1117/12.947676
Show Author Affiliations
Paul S. Sherman, Oakland University (United States)
Vernon M. Fernandez, Oakland University (United States)
Yau Y. Hung, Oakland University (United States)

Published in SPIE Proceedings Vol. 0955:
Industrial Laser Interferometry II
Y.Y. Hung; Ryszard J. Pryputniewicz, Editor(s)

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