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Proceedings Paper

Quality Control Using Optical Probe Arrays
Author(s): Robert M. Stewart
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Paper Abstract

Low cost, optical probes, can be combined into an inspection array, and the go/no-go outputs can be analyzed by a high speed programmable logic controller (PLC). The PLC can be remotely addressed to change the desired level of quality control. The PLC can provide on-line data for blow-by-blow statistical process control (SPC).

Paper Details

Date Published: 16 January 1989
PDF: 5 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947632
Show Author Affiliations
Robert M. Stewart, Nedco (Canada)

Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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