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Proceedings Paper

New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI)
Author(s): A. R. Ganesan; R. S. Sirohi
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Paper Abstract

A new method of contouring 3-D objects in real-time is suggested. The technique makes use of Digital Speckle Pattern Interferometry (DSPI) alongwith an in-plane sensitive optical configuration. The contour interval can be varied in real-time by varying the tilt applied to the object. The variation of the contour interval with the tilt angle and the angle between the illumination beams is discussed. The decorrelation of speckle pattern due to tilt and consequently the disappearance of the fringes is also discussed. Experimental results have been presented for a variety of objects.

Paper Details

Date Published: 16 January 1989
PDF: 6 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947606
Show Author Affiliations
A. R. Ganesan, Indian Institute of Technology (India)
R. S. Sirohi, Indian Institute of Technology (India)

Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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