Share Email Print
cover

Proceedings Paper

Interferometric Measurements Of Remote Surfaces Profile's Through An Optical Fiber
Author(s): Jose E. Calatroni; Carmen Sainz; Gilbert Tribillon
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An interferometric profilometer with fiber transmission of the 1-D surface profile is presented. The system works in real time by purely optical means. A CCD linear array is used as a light detector. The received interferogram is processed by a microcomputer. Depth resolution is up to λ/256.

Paper Details

Date Published: 16 January 1989
PDF: 6 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947588
Show Author Affiliations
Jose E. Calatroni, Universidad Simon Bolivar (Venezuela)
Carmen Sainz, Universidad Metropolitana Final Av. Boyaca (Venezuela)
Gilbert Tribillon, Laboratoire d'Opticrue, Faculte des Sciences (France)


Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

© SPIE. Terms of Use
Back to Top