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Proceedings Paper

An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory
Author(s): Fu-long Dai; James McKelvie; Daniel Post
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Paper Abstract

The process of moire interferometry is given mathematical description in terms of the classical theory of optical interference. The governing relationship between displacement and fringe order is derived, and the analysis is extended to cover carrier patterns, double exposure methods, and initial fringe pattern elimination. Various processes for obtaining patterns of displacement derivatives are also described mathematically.

Paper Details

Date Published: 16 January 1989
PDF: 10 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947581
Show Author Affiliations
Fu-long Dai, Tsinghua University (China)
James McKelvie, University of Strathclyde (Scotland)
Daniel Post, Virginia Polytechnic Institute and State University (United States)


Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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