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Proceedings Paper

Talbot Bands : Determination Of Material Dispersion
Author(s): M. Warenghem; C. P. Grover
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Paper Abstract

A new method for the wavelength dependence of the index of refraction has been recently proposed. It is based upon an accurate determination of the positions of dark bands which appear in the source spectrum observed in the focal plane of a spectroscope while a phase plate is partly inserted in its field. After the method has been reminded, experimental results obtained with known glasses and liquid crystals are reported proving the efficiency and the reliability of the method. In addition of those experimental data, a discussion is devoted to the versality of this new method also the accuracy of the results is considered.

Paper Details

Date Published: 16 January 1989
PDF: 6 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947578
Show Author Affiliations
M. Warenghem, Universite de Lille I (France)
C. P. Grover, National Research Council of Canada (Canada)


Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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