Share Email Print

Proceedings Paper

The Evaluation Of A Random Sampling Error On The Polynomial Fit Of Subaperture Test Data
Author(s): Jeff L. Lewis; William P. Kuhn; H.Philip Stahl
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The interpretation of interferometric test data frequently involves fitting sampled data points to some set of polynomials and the removal of a reference wavefront. Random uncorrelated sampling errors introduces inaccuracies into the polynomial fit. This process is complicated when testing a large component with multiple non-overlapping apertures by the need to reconstruct the total surface shape from the related subaperture data sets. This paper examines the error introduced into the polynomial fit by random uncorrelated sampling errors. The error, expressed as an rms value, is represented as a projection onto the reference and total polynomial spaces.

Paper Details

Date Published: 16 January 1989
PDF: 7 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947577
Show Author Affiliations
Jeff L. Lewis, Breault Research Organization, Inc. (United States)
William P. Kuhn, Breault Research Organization, Inc. (United States)
H.Philip Stahl, Breault Research Organization, Inc. (United States)

Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

© SPIE. Terms of Use
Back to Top