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Proceedings Paper

Phase-Measuring Interferometry: Applications And Techniques
Author(s): Jay A. Tome; H.Philip Stahl
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Paper Abstract

A review of the current state of phase-measuring interferometry is presented. Emphasis is placed on the broadening field of applications for the technique including; micro-surface topology, non-destructive testing, and surface contouring. Advance techniques of extending the range of phase-measuring interferometry and high speed data sampling are presented, along with two other techniques of interest.

Paper Details

Date Published: 16 January 1989
PDF: 7 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947575
Show Author Affiliations
Jay A. Tome, Breault Research Organization (United States)
H.Philip Stahl, Breault Research Organization (United States)


Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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