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Proceedings Paper

Process-Induced Passivation And Stability For High Yield Y:Ba:Cu:O Superconductors
Author(s): P. Y. Hsieh; James Ye; L. Q. Wang; D. Shaw; J. P. Zheng; Q. F. Xiao
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Paper Abstract

In Y-Ba-Cu-O systems high yield superconducting devices can be made from the top-quality bulk materials. We report here the stability of bulk oxide compounds in order to search a unique method to produce high Tc and hopefully shorten the period of processing. Systematic measurements of resistivity, magnetization, composition, and X-ray diffraction have been made on samples that have the same chemical prescription (pre-heating)but different heat processing. The processing was varied to find the optimum combination of the calcining time, sintering time, and annealing time at 650 C. We have found that the Tc is stable if the dominant phase remains. A ratio of Meissner: Shielding magnetizations of 61:100 was found under optimum conditions. The intensity and position of the X-ray diffraction peak for (103) was independent of elapsed time but strongly dependent on processing. Long-time annealing should not improve the properties of superconductors if either calcining or sintering time is not long enough. In some cases, it will not enhance the superconducting phase and the stability shows no further improvement. The magnetizations due to Shielding and Meissner effects definitely change with aging time but their ratio remains the same. A correlation between the peak intensity at (103) with the value of FC (Field-Cooling)/ZFC (Zero-Field-Cooling) has been found and corroborates the commonly held view in the significance of the amount of superconducting phases on superconductivity. Based on this study, the stability and degradation of superconducting devices associated with bulk materials will be further investigated.

Paper Details

Date Published: 23 August 1988
PDF: 3 pages
Proc. SPIE 0948, High-Tc Superconductivity: Thin Films and Devices, (23 August 1988); doi: 10.1117/12.947466
Show Author Affiliations
P. Y. Hsieh, State University of New York/Buffalo (United States)
James Ye, State University of New York/Buffalo (United States)
L. Q. Wang, State University of New York/Buffalo (United States)
D. Shaw, State University of New York/Buffalo (United States)
J. P. Zheng, State University of New York/Buffalo (United States)
Q. F. Xiao, State Univ. of New York/Albany (United States)

Published in SPIE Proceedings Vol. 0948:
High-Tc Superconductivity: Thin Films and Devices
Cheng-Chung John Chi; R. Bruce van Dover, Editor(s)

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