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Proceedings Paper

Characterization Of An Experimental Thin-Film Interconnection Structure.
Author(s): G. Arjavalingam; P. May; J.-M. Halbout; G. V. Kopcsay
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Paper Abstract

Measurements and simulation of high-speed pulse propagation and cross-talk on an experimental thin-film transmission line structure are presented. The measurements are carried out using both an optoelectronic pulse generation and detection technique, and a recently developed non-contact high-speed sampling method based on a picosecond electron beam. We find through simulation that a quasi-static coupled transmission line model with frequency dependent skin-effect loss accurately predicts the pulse delay and distortion characteristics of our sample.

Paper Details

Date Published: 8 September 1988
PDF: 7 pages
Proc. SPIE 0947, Interconnection of High Speed and High Frequency Devices and Systems, (8 September 1988); doi: 10.1117/12.947458
Show Author Affiliations
G. Arjavalingam, IBM T.J.Watson Research Center (United States)
P. May, IBM T.J.Watson Research Center (United States)
J.-M. Halbout, IBM T.J.Watson Research Center (United States)
G. V. Kopcsay, IBM T.J.Watson Research Center (United States)


Published in SPIE Proceedings Vol. 0947:
Interconnection of High Speed and High Frequency Devices and Systems
Alfred P. DeFonzo, Editor(s)

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