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Proceedings Paper

Algorithm For LI Near Gradient Refractive Indices
Author(s): Roy F. Potter
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Paper Abstract

Electronic and optical materials can and are being fabricated in a variety of forms including monotonic variation of their physical properties. A characteristic matrix for translating the optical parameters in media having linear gradients In complex refractive indices Is the basis for an algorithm for a program to calculate optical parameters for ellipsometry, reflectance and transmittance. Illustrative examples are given for three different types of gradient systems such as might be encountered in opto-electronic applications.

Paper Details

Date Published: 9 August 1988
PDF: 7 pages
Proc. SPIE 0946, Spectroscopic Characterization Techniques for Semiconductor Technology III, (9 August 1988); doi: 10.1117/12.947420
Show Author Affiliations
Roy F. Potter, Western Waohlnaton University (United States)

Published in SPIE Proceedings Vol. 0946:
Spectroscopic Characterization Techniques for Semiconductor Technology III
Orest J. Glembocki; Fred H. Pollak; Fernando A. Ponce, Editor(s)

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