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Proceedings Paper

Photoreflectance And The Seraphin Coefficients In Quantum Well Structures
Author(s): X. L. Zheng; D. Helman; B. Lax; F. A. Chambers
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Paper Abstract

The lineshape of photoreflectance spectra from quantum well structures remains an unsolved problem, despite previous attemps to develop an adequate model using Seraphin coefficients for a bulk semiconductor. We show that the Seraphin coefficients in quantum well structures are substantially different from those in the bulk. We obtain analytical forms of the coefficients for a single quantum well, which show that the interference phase depends on the geometrical structure of the quantum well. The predictions are confirmed by our experimental photoreflectance data from quantum well samples. Our study suggests a new approach to the study of the lineshape problem of modulation reflectance.

Paper Details

Date Published: 9 August 1988
PDF: 5 pages
Proc. SPIE 0946, Spectroscopic Characterization Techniques for Semiconductor Technology III, (9 August 1988); doi: 10.1117/12.947411
Show Author Affiliations
X. L. Zheng, Massachusetts Institute of Technology (United States)
D. Helman, Massachusetts Institute of Technology (United States)
B. Lax, Massachusetts Institute of Technology (United States)
F. A. Chambers, Amoco Corporation (United States)


Published in SPIE Proceedings Vol. 0946:
Spectroscopic Characterization Techniques for Semiconductor Technology III
Orest J. Glembocki; Fred H. Pollak; Fernando A. Ponce, Editor(s)

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