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Proceedings Paper

Adaptation Of A WYKO LADITE Interferometer To Another Wavelength
Author(s): Jay H. Lowry; John H. Belk
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Paper Abstract

The software and computing power of the WYKO LADITE interferometer make it a desirable tool in applications that are outside the factory set wavelength. However, the focus shift involved in going from the factory set wavelength to, for example, Nd:YAG's 1.06 micron line introduces systematic errors. This paper describes a method to refocus the commercially available instrument without compromising measurement accuracy. This modification allowed testing of a high quality laser system at its operational wavelength.

Paper Details

Date Published: 4 August 1988
PDF: 5 pages
Proc. SPIE 0941, Automated Testing of Electro-Optical Systems, (4 August 1988); doi: 10.1117/12.947182
Show Author Affiliations
Jay H. Lowry, McDonnell Douglas (United States)
John H. Belk, McDonnell Douglas (United States)

Published in SPIE Proceedings Vol. 0941:
Automated Testing of Electro-Optical Systems
John Nestler; Philip I. Richardson, Editor(s)

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