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Proceedings Paper

Software Test Requirements For The Support Of Electro-Optical Systems
Author(s): Arnold M. Greenspan; Martin G. Weiner
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Paper Abstract

The test and support of Electro-Optical (EO) systems introduces numerous unique demands that are not encountered when testing other types of equipment. This demand is amplified when test and support is undertaken using automated test techniques or Automatic Test Equipment (ATE). This latter case is increasingly becoming not only the method of choice but the method of necessity as EO systems become increasingly complex. This paper will acquaint the reader with some of the special requirements that are encountered when testing and/or supporting EO systems. It will concentrate on automatic testing and illustrate how the demands of EO testing were successfully satisfied particularly as regards software methods and techniques needed for EO systems using ATE within the DoD environment.

Paper Details

Date Published: 4 August 1988
PDF: 7 pages
Proc. SPIE 0941, Automated Testing of Electro-Optical Systems, (4 August 1988); doi: 10.1117/12.947173
Show Author Affiliations
Arnold M. Greenspan, SofTech Test Systems Group (United States)
Martin G. Weiner, SofTech Test Systems Group (United States)


Published in SPIE Proceedings Vol. 0941:
Automated Testing of Electro-Optical Systems
John Nestler; Philip I. Richardson, Editor(s)

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