Share Email Print

Proceedings Paper

FLIR Characterization: Yesterday And Today
Author(s): Gerald C. Holst
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A variety of modern test equipment is available to measure the NEDT, SITF, MRT, and MTF of thermal imaging systems. Since this equipment processes data in the digital domain, it may introduce artifacts such as image blurring, uncertainty in edge location and aliasing. These effects are pronounced in undersampled situations which may be encountered with frame grabbers or image analyzers. Although the performance measures are usually specified in terms of target-background temperature differential, thermal imaging systems respond to power or photon differences. Since power differences are not linearly related to temperature differences, the NEDT, SITF and MRT are functions of the ambient temperature.

Paper Details

Date Published: 4 August 1988
PDF: 6 pages
Proc. SPIE 0941, Automated Testing of Electro-Optical Systems, (4 August 1988); doi: 10.1117/12.947170
Show Author Affiliations
Gerald C. Holst, Martin Marietta Electronics Systems (United States)

Published in SPIE Proceedings Vol. 0941:
Automated Testing of Electro-Optical Systems
John Nestler; Philip I. Richardson, Editor(s)

© SPIE. Terms of Use
Back to Top