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Proceedings Paper

Electro-Optic Sampler For Gallium Arsenide Integrated Circuits
Author(s): B. H. Kolner; K. J. Weingarten; D. M. Bloom
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Paper Abstract

We report a new technique for directly sampling electrical waveforms in GaAs integrated circuits with picosecond time resolution. This noninvasive sampling system provides a powerful new tool for the design and diagnosis of GaAs integrated circuits. The technique is based on the intrinsic electro-optic effect in GaAs and utilizes a mode-locked and compressed Nd:YAG laser to electro-optically sample the fringing fields of microstrip transmission lines in GaAs integrated circuits. The frequency doubled output of the laser can be used to excite on-chip photodetectors which serve as test signal generators, or the circuits can be driven by external signal generators. We also demonstrate how the sampling system can be operated as a harmonic mixer for evaluation of pulse-to-pulse timing jitter in mode-locked lasers.

Paper Details

Date Published: 2 April 1985
PDF: 5 pages
Proc. SPIE 0533, Ultrashort Pulse Spectroscopy and Applications, (2 April 1985); doi: 10.1117/12.946553
Show Author Affiliations
B. H. Kolner, Stanford University (United States)
K. J. Weingarten, Stanford University (United States)
D. M. Bloom, Stanford University (United States)


Published in SPIE Proceedings Vol. 0533:
Ultrashort Pulse Spectroscopy and Applications
M. J. Soileau, Editor(s)

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