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Proceedings Paper

On-Chip, Picosecond, Electrical-Characterization Measurements For Si Integrated Circuits
Author(s): R. B. Hammond; N. G. Paulter; R. S. Wagner; W. R. Eisenstadt; R. W. Dutton; D. R. Bowman
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Paper Abstract

We have developed integrated photoconductors for picosecond pulse generation and sampling on Si integrated circuits. Here we describe the device implementation.

Paper Details

Date Published: 2 April 1985
PDF: 3 pages
Proc. SPIE 0533, Ultrashort Pulse Spectroscopy and Applications, (2 April 1985); doi: 10.1117/12.946552
Show Author Affiliations
R. B. Hammond, Los Alamos National Laboratory (United States)
N. G. Paulter, Los Alamos National Laboratory (United States)
R. S. Wagner, Los Alamos National Laboratory (United States)
W. R. Eisenstadt, University of Florida (United States)
R. W. Dutton, Stanford University (United States)
D. R. Bowman, Stanford University (United States)

Published in SPIE Proceedings Vol. 0533:
Ultrashort Pulse Spectroscopy and Applications
M. J. Soileau, Editor(s)

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