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Proceedings Paper

Yield Analysis For Electroluminescent Panel Development
Author(s): M. I. Abdalla; E. A. Davey; T. FohI; J. L. Gibbons; L. L. Hope; K. A. Petersen; J. L. Plumb; M. P. Schrank
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Paper Abstract

Yield issues for fabrication of electroluminescent display panels through the development program cycle are discussed. A model based on learning curve theory is presented which allows estimation of time and resources required for development of panels meeting prescribed technical specifications including freedom from defects. The analysis is supported by data on development history of EL devices.

Paper Details

Date Published: 13 May 1985
PDF: 6 pages
Proc. SPIE 0526, Advances in Display Technology V, (13 May 1985); doi: 10.1117/12.946381
Show Author Affiliations
M. I. Abdalla, GTE Lighting Products (United States)
E. A. Davey, GTE Lighting Products (United States)
T. FohI, GTE Lighting Products (United States)
J. L. Gibbons, GTE Lighting Products (United States)
L. L. Hope, GTE Lighting Products (United States)
K. A. Petersen, GTE Lighting Products (United States)
J. L. Plumb, GTE Lighting Products (United States)
M. P. Schrank, GTE Lighting Products (United States)


Published in SPIE Proceedings Vol. 0526:
Advances in Display Technology V
Elliott Schlam, Editor(s)

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