Share Email Print

Proceedings Paper

Comparison Of Visibility Of Standard Scratches
Author(s): Lionel R. Baker; Jagpal Singh
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The increasing requirement for stringent standards relating to surface imperfections on certain optical components has highlighted the need for objective methods of measuring such defects. In recent years, several Standards Committees and many individual companies have developed their own series of standard defects which are compared visually with a defect observed on a test piece. This paper describes a comparator technique for measuring the visibility of a test defect relative to any chosen standard and discusses the relationship between the uncertainty of this measurement and the various design parameters such as lens aperture, focal setting, magnification and source coherence. The measured visibility of a selection of standard scratches as recommended in BS, DIN and MIL standards are recorded, together with an in-house comparator set provided by Kodak Ltd. The method enables any defect to be quantified in terms of a line-equivalent width and therefore provides means for the intercomparison of different standards.

Paper Details

Date Published: 3 September 1985
PDF: 6 pages
Proc. SPIE 0525, Measurement and Effects of Surface Defects & Quality of Polish, (3 September 1985); doi: 10.1117/12.946346
Show Author Affiliations
Lionel R. Baker, Sira Limited (England)
Jagpal Singh, Instruments Design Development & Facilities Centre (India)

Published in SPIE Proceedings Vol. 0525:
Measurement and Effects of Surface Defects & Quality of Polish
Lionel R. Baker; Harold E. Bennett, Editor(s)

© SPIE. Terms of Use
Back to Top