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Proceedings Paper

ASTM And OSA Efforts To Develop An Optical Surface Roughness Measurement Standard
Author(s): John A. Detrio
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Paper Abstract

The development of a formal standard test method for the surface microroughness characterization of optical components is outlined. The results of an interlaboratory comparison of the test method are presented to illustrate the advantages and limitations of this approach to measure effective rms surface roughness. The lab-to-lab variations in measured total integrated scatter (TIS), effective roughness, were found to be about +15%. The within-lab variations were about ±5%.

Paper Details

Date Published: 3 September 1985
PDF: 6 pages
Proc. SPIE 0525, Measurement and Effects of Surface Defects & Quality of Polish, (3 September 1985); doi: 10.1117/12.946345
Show Author Affiliations
John A. Detrio, University of Dayton Research Institute (United States)


Published in SPIE Proceedings Vol. 0525:
Measurement and Effects of Surface Defects & Quality of Polish
Lionel R. Baker; Harold E. Bennett, Editor(s)

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